Integrated circuit arrangement in MOS-technology with field-effe

Details Integrated circuit arrangement in MOS-technology with field-effe Integrated circuit arrangement in MOS-technology with field-effe

1980-02-01

1982-06-22

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, 324158R, G01R 3122, G01R 1512

Patent

active

043364950

ABSTRACT:
In order to improve yield, integrated circuits may advantageously be tested using internal test circuitry during fabrication to locate faults. In order to conduct the necessary tests without providing an extra external test connection, the invention contemplates using a required existing terminal of an integrated circuit along with a test circuit which is activated by a voltage outside the normal operating voltage range, such as a voltage of opposite polarity to that used during normal operation.

REFERENCES:
patent: 3815025 (1974-06-01), Jordan
patent: 4253059 (1981-02-01), Bell et al.
Ramamoorthy, C. V.; "A Structural Theory . . ."; AFIPS Conference Proc., 1967 Spring Joint Computer Conference 30; pp. 743-756.
Ramamoorthy, C. V.; "Analysis of Graphs . . ."; J. of Assoc. for Computing Machinery; vol. 13; No. 2; Apr. 1966; pp. 211-222.
Tietze et al.; "Halbleiter-Schaltungstechnik"; 4th Edition, 1978; pp. 77-135.

Affiliated with

Also associated with

Rating

Integrated circuit arrangement in MOS-technology with field-effe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit arrangement in MOS-technology with field-effe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit arrangement in MOS-technology with field-effe will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-654896