Integrated circuit architecture having an array of test cells pr

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324 731, G01R 3128

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active

061508071

ABSTRACT:
A new circuit architecture is provided for testing digital integrated circuits which allows one to arbitrarily force any combination of logic values to be simultaneously driven onto any combination of internal nets. This allows all of the connections to each internal logic cell, and the logic cell itself, to be verified by applying a set of test patterns to each logic cell individually. In this way, the integrity of the entire device can be verified without having knowledge of the operation of the circuit as a whole.

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