Integrated circuit and method of testing

Details Integrated circuit and method of testing Integrated circuit and method of testing

1992-12-23

1995-05-02

Cosimano, Edward R.

Excavating

324 731, 364579, 371 221, H04B 1700, G05B 2302

Patent

active

054126649

ABSTRACT:
An improved integrated circuit (IC) comprises test logic circuitry operably coupled to a serial port, multiplexing circuitry coupled to the output of the IC and a data bus, and gating circuitry coupled to logic sections of the IC and the data bus. The IC may be tested by providing test parameters to the IC which includes identification of a particular logic circuit to be tested and test vectors for the particular logic circuit. Next, access is provided to the data bus for the particular logic circuit based on the test parameters. Finally, external test equipment is provided access to part of the data bus based on the test parameters such that the external testing equipment monitors data placed on the data bus by the particular logic section.

REFERENCES:
patent: 3082374 (1963-03-01), Buuck
patent: 3487304 (1969-12-01), Kennedy
patent: 4724378 (1988-02-01), Murray et al.
patent: 4897842 (1990-01-01), Herz et al.
patent: 5177630 (1993-01-01), Gautzoulis et al.
patent: 5193092 (1993-03-01), Hartoog et al.

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