Integrated circuit and method of design thereof

Electricity: electrical systems and devices – Housing or mounting assemblies with diverse electrical... – For electronic systems and devices

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C361S764000, C361S823000, C257S698000, C257S778000, C700S245000, C700S254000

Reexamination Certificate

active

06414852

ABSTRACT:

TECHNICAL FIELD
The present invention relates to a semiconductor integrated circuit and a method of designing the same.
BACKGROUND OF ART
A functional block used for a system LSI is registered as a design asset or intellectual property (IP) in a library for reuse when a system LSI is newly designed. This type of functional block is called an IP block. The IP block is also called a virtual component (VC) such as an actual component on print-circuit boards.
The functional block includes a hard virtual component (HVC) of which the contents can be handled as a black box. Different from a soft virtual component (SVC) and a firm virtual component (FVC), the hard virtual component (HVC) is provided as polygon data, which has the disadvantages of design inflexibility and difficult process transplantation, but the advantage of capability of precisely estimating performance and physical dimensions.
Because of the limitations to performance such as integrity, speed, and power consumption of the functional block itself, input-output terminals of the functional block which can be handled as a black box are provided with routing as described below.
FIG. 10
shows an internal layout of a conventional functional block.
A functional block
20
has macrocells
30
to
33
, input-output terminals
150
to
153
, and multi-layer wirings
200
to
203
inside the functional block.
The macrocell
30
is connected to the input-output terminal
150
via the multi-layer wiring
200
. In the same way, the macrocell
31
is connected to the input-output terminal
151
via the multi-layer wiring
201
, the macrocell
32
is connected to the input-output terminal
152
via the multi-layer wiring
202
, and the macrocell
33
is connected to the input-output terminal
153
via the multi-layer wiring
203
.
In
FIG. 10
, the macrocell
30
is connected to the input-output terminal
150
on an outline
120
nearest the macrocell
30
via the multi-layer wiring
200
. In the same way, the macrocells
31
to
33
are connected to the input-output terminals
151
to
153
on the outline
120
nearest these cells.
When routing functional blocks each having a layout as shown in
FIG. 10
, the routing may significantly detour, resulting in an extended length of routing which impairs the signal delay characteristics.
FIG. 11
shows an example of an extreme routing detour. The semiconductor integrated circuit of
FIG. 11
has functional blocks
20
to
24
closely placed each other, with the functional block
20
being connected with each of the functional blocks
21
to
24
. The input-output terminal
150
of the functional block
20
is connected to the input-output terminal
170
of the functional block
24
by a multi-layer wiring
250
. In the same way, the input-output terminal
151
of the functional block
20
is connected to the input-output terminal
171
of the functional block
23
by the multi-layer wiring
251
, the input-output terminal
152
is connected to an input-output terminal
172
of the functional block
22
by a multi-layer wiring
252
, and the input-output terminal
153
is connected to an input-output terminal
173
of the functional block
21
by a multi-layer wiring
253
.
In this manner, routing among functional blocks may become complicated according to the relative positions of the functional blocks. Because semiconductor integrated circuits commonly used have several hundreds or more functional blocks, the routing connections among the functional blocks may become very complicated.
In addition, as shown in
FIG. 12
, some semiconductor integrated circuits use signal input-output ports
100
to
103
of macrocells
30
to
33
inside a functional block
20
as the input-output terminal for the functional block
20
.
The routing of macrocells inside the functional block
20
having a configuration as shown in
FIG. 12
is sometimes hindered by obstacles
50
and
51
which are formed in the functional block
20
due to congestion of the routing inside the semiconductor integrated circuit. The obstacles
50
and
51
are formed when wiring layers are subjected to some restrictions such as lack of routing resources.
An objective of the present invention is to provide a semiconductor integrated circuit having a functional block in which the degree of freedom in the placement and routing can be increased and which, therefore, can be reused as a design asset, and further to provide a method of designing such a semiconductor integrated circuit.
DISCLOSURE OF THE INVENTION
A semiconductor integrated circuit in one aspect of the present invention comprises:
functional blocks each of which includes an outline having at least four sides; and
a wiring layer connecting the functional blocks,
wherein at least one of the functional blocks has at least four terminals, each one of which are placed on each one of at least four sides of the outline, and
wherein all of the at least four terminals are connected to one point in the at least one of the functional blocks, at least one of the at least four terminals is an effective terminal connected to at least another one of the functional blocks, and a rest of the at least four terminals is a dummy terminal which is not connected to any other of the functional blocks.
This configuration makes it possible to select one terminal which is positioned at the most advantageous point for routing among the terminals placed on each of at least four sides of the functional block as an effective terminal when functional blocks are routed. Use of this effective terminal for connecting functional blocks can prevent a significant detouring of the routing, reduce the length of routing, and solve the signal delay problem. Terminals other than the effective terminal are dummy terminals. Because routing inside the functional block is fixed by this configuration, the electrical characteristics and signal delay characteristics become fixed and stable. Therefore, once a delay simulation inside the functional block has been performed, it is unnecessary to perform the delay simulation again when the functional block is reused thereafter. The functional block in this aspect of the present invention has increased freedom of placement and routing because the designer does not need to look for a placement in which the routing has an advantage by inverting the placement and routing in various directions.
At least two terminals among the at least four terminals of the at least one of the functional blocks may be effective terminals each of which is connected to different one of the other of the functional blocks.
The routing length may be decreased by this placement as compared with the case where routing is provided from one terminal to two functional blocks.
The at least one of the functional blocks may have the effective terminals on at least one side of the outline.
In this instance, each of the effective terminals may be connected to different one of the other of the functional blocks.
The routing length may be decreased by this placement as compared with the case where each of the two effective terminals on different sides is connected to each of the two functional blocks.
Two of the functional blocks may be located adjacent each other, and the effective terminals respectively placed on two facing sides of each of the outlines of the two of the functional blocks may be connected.
The length of the routing among the functional blocks can be minimized in this way.
Macrocells may be placed in the at least one of the functional blocks, and the at least four terminals may be connected in common to one of the macrocells.
Another aspect of the present invention provides a method of designing a semiconductor integrated circuit including:
functional blocks each of which includes an outline having at least four sides; and a wiring layer connecting various part within each of the functional blocks and connecting the functional blocks, by an automatic placement-routing device, the method comprising:
a first step of registering a definition of placing terminals on the outline of at least

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Integrated circuit and method of design thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit and method of design thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit and method of design thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2901759

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.