Integrated circuit and method for testing the integrated circuit

Details Integrated circuit and method for testing the integrated circuit Integrated circuit and method for testing the integrated circuit

1989-04-21

1990-12-04

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 225, 371 251, G01R 3128

Patent

active

049756419

ABSTRACT:
An integrated circuit which can be operated in a test mode includes a test input terminal for instructing the switching between an actual use mode and a test mode, a plurality of input terminals, an AND gate for performing logic operations on the input signals from the input terminals, a plurality of flip-flops for storing each of the input signals from the remaining plurality of input terminals by using the outpout of the AND gate as a timing signal, a decoder for producing a test mode designating signal to select one test mode from a plurality of test modes in response to each of the outputs of the flip-flops, and a control circuit for operating a processing circuit in the test mode designated by the test mode designating signal in response to the test mode setting signal from the test input and the test mode designating signal from the decoder. The configuration of this circuit permits the testing of the signals from the output terminals of the integrated circuit without excessively increasing the number of input terminals necessary for the test mode.

REFERENCES:
patent: 3961252 (1976-06-01), Eichelberger
patent: 4385275 (1983-05-01), Delvigne
patent: 4697140 (1987-09-01), Saito et al.
patent: 4701920 (1987-10-01), Resnick et al.
patent: 4816757 (1989-03-01), Hutchins
patent: 4837505 (1989-06-01), Mitsunobu

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