Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-03-08
2011-03-08
Charioui, Mohamed (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S060000, C702S064000, C307S009100, C307S052000
Reexamination Certificate
active
07904260
ABSTRACT:
An integrated circuit device and method for classifying electrical devices is disclosed. A reference current response of a plurality of electrical devices is determined and stored in a memory. Real-time current response of a specific electrical device is measured and stored in the memory. A processor compared the measured real-time current response of the specific electrical device to the reference current responses of the plurality of electrical devices. A classification of the electrical device is then made based on the comparison.
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Burlak Gary Joseph
Mirowski Marian
Charioui Mohamed
Jorgenson Lisa K.
Ngon Ricky
STMicroelectronics Inc.
Szuwalski Andre M.
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