Integrated circuit

Details Integrated circuit Integrated circuit

1996-08-05

1998-08-04

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3126

Patent

active

057899320

ABSTRACT:
An integrated circuit includes a circuit configuration for receiving a test signal and establishing an output signal as a consequence thereof. A test configuration checks if the output signal is within a given tolerance range. The test configuration has an output at which a corresponding result signal to be transmitted to outside the integrated circuit is generated when testing is performed.

REFERENCES:
patent: 4712061 (1987-12-01), Lach
patent: 4853628 (1989-08-01), Gouldsberry et al.
patent: 4956602 (1990-09-01), Parrish
patent: 5068547 (1991-11-01), Gascoyne
patent: 5097205 (1992-03-01), Toyoda
patent: 5248936 (1993-09-01), Nakata et al.
patent: 5446395 (1995-08-01), Goto
patent: 5457381 (1995-10-01), Farwell
Patents Abstracts of Japan, E-365, Dec. 11, 1985, vol. 9, No. 315 and JP-A-60-147127 (OKI) Aug. 3, 1985.

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