Integrated bit error rate test function in analog channel unit o

Details Integrated bit error rate test function in analog channel unit o Integrated bit error rate test function in analog channel unit o

1993-07-30

1995-09-05

Chin, Stephen

Telephonic communications

Diagnostic testing, malfunction indication, or electrical...

With blocking of normal usage

379 34, 379 59, 371 201, 375224, 370 13, 370 15, H04M 124, H04J 116, G06F 1100, H04B 346

Patent

active

054486165

ABSTRACT:
An internal bit error rate (BER) test capability is built into the analog channel unit of a digital cellular base station. This test capability is controlled by the mobile telephone switching office (MTSO) to automatically perform BER measurements. The analog channel unit with this integrated function performs random sequence generation, continuous frequency shift keying (FSK) modulation, FSK random sequence acquisition, FSK demodulation and bit error tallying. The BER test functions built into the analog channel unit allow the tests to be performed via remote control from an operations and maintenance center of the MTSO. Having the BER test functions built into the analog channel unit reduces the number of physical interfaces which the analog channel unit has to support.

REFERENCES:
patent: 5031204 (1991-07-01), McKernan
patent: 5081666 (1992-01-01), Blaschek et al.
patent: 5233628 (1993-08-01), Rappaport et al.
patent: 5325397 (1994-06-01), Scholz et al.
patent: 5337316 (1994-08-01), Weiss et al.
"Multiple User Interference In FH-MFSK Mobile Radio", Mizuno et al., 1989 IEEE, see edit document.

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