Measuring and testing – Vibration – By mechanical waves
Patent
1995-06-29
1998-06-09
Oda, Christine K.
Measuring and testing
Vibration
By mechanical waves
73617, G01N 2906
Patent
active
057637857
ABSTRACT:
A beam forming and focusing processing circuit for use in an ultrasound imaging system. The system incorporates a plurality of the processing circuits which differentially delay imaging signals in order to generate an output in which the imaging signals from each circuit implement the desired differential delay. Each of the processing circuits include a first delay line having a plurality of delay units operable for receiving the imaging signals and converting same into sampled data. A selection control circuit is operable for reading the sampled data from a selected first delay unit of the first delay line so as to correspond to a selected first time delay to accommodate fine delay resolution of the imaging signals. A second delay line having a plurality of delay units is operable for sensing the sampled data from the selected first delay unit. The control circuit is further operable for reading the sampled data from a selected second delay unit of said second delay line so as to correspond to a selected second delay time to accommodate coarse delay resolution of the imaging signals. The processing circuits are preferably integrated onto a single microchip.
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Massachusetts Institute of Technology
Oda Christine K.
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