Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1997-11-05
1999-03-23
Nguyen, Nam
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438719, 438725, 438742, 438952, H01L 2100
Patent
active
058859020
ABSTRACT:
A composite of an anti-reflective coating on polysilicon is accurately etched to form a polysilicon pattern by initially etching the ARC with gaseous plasma containing helium and/or nitrogen which is substantially inert with respect to polysilicon.
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Bell Scott A.
Blasingame Tom
Gupta Subash
Advanced Micro Devices , Inc.
Nguyen Nam
Ver Sterg Steven H.
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