Integral test input for electro-optically multiplexed FLIR syste

Details Integral test input for electro-optically multiplexed FLIR syste Integral test input for electro-optically multiplexed FLIR syste

1980-11-17

1982-05-04

Richardson, Robert L.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

358139, 358229, 250330, 250333, H04N 533

Patent

active

043285163

ABSTRACT:
In a forward-looking infared system of the type in which a cryogenically led infared detector array drives a light-emitting array whose video output is focused onto the target of an electro-optical multiplexer, such as a vidicon tube, which drives a CRT display, the video chain may be tested without cool-down of the infared detector. A point-source of light, such as a tungsten lamp mounted forward of and at the side of the vidicon target, is energized to project light onto the target surface at an acute angle, setting up a gradient of light intensity across each of the horizontally scanned lines.

REFERENCES:
patent: 3718757 (1973-02-01), Gulitz et al.
patent: 4063093 (1977-12-01), Astheimer et al.

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