Insulated gate type semiconductor device with potential detectio

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Combined with field effect transistor

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257355, H01L 2974

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active

06069372&

ABSTRACT:
Internal gate electrodes (71) are all connected in common to a gate terminal, and a floating gate electrode (72) is connected to the gate electrode of an NMOS transistor (M1). An external emitter electrode (91) is provided on a first major surface of P-type diffused lease region (21), and N-type diffused emitter region (31) and P-type diffused base region (21) are short-circuited. The source of the NMOS transistor (M1) and an emitter terminal are also connected to the external emitter electrode (91). The drain of the NMOS transistor (M1) is connected to an external terminal.

REFERENCES:
patent: 4783690 (1988-11-01), Walden et al.
patent: 5162966 (1992-11-01), Fujihira
patent: 5360984 (1994-11-01), Kirihata
patent: 5714775 (1998-02-01), Inoue et al.
patent: 5798538 (1998-08-01), Nadd et al.
Tomoyuki Yamazaki, et al., "Avalanche Secured IGBT," 1992 National Convention Record I.E.E. Japan, vol. 5, pp. 5-16.

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