Insulated gate field effect transistor

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357 238, 357 91, 357 231, H01L 2978

Patent

active

049144928

ABSTRACT:
An insulated gate field effect transistor, in which at least the drain region is surrounded by an impurity region of the same conductivity type as and a higher impurity concentration than the substrate, is disclosed. A portion of the impurity region under the drain region contains both of P-type and N-type impurities to form an abrupt profile therby depleting the portion with a depletion layer by the built-in potential.

REFERENCES:
patent: 4242691 (1980-12-01), Kotani
D. Hodges & M. Jackson, "Analysis & Design of Integrated Circuits", McGrawHill, New York, 1983, pp. 132-135.
S. SXE, "Physics of Semiconductor Devices", John Wiley and Sons, New York, 1981, p. 488.

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