Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Combined with field effect transistor
Reexamination Certificate
2007-07-31
2007-07-31
Baumeister, B. William (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Regenerative type switching device
Combined with field effect transistor
C257SE29027
Reexamination Certificate
active
10109838
ABSTRACT:
An IGBT includes a plurality of n+doped regions (11) selectively formed in a main surface (103) of a p+semiconductor layer (12) opposite from an n type semiconductor layer (80) without being connected to the n type semiconductor layer (80). The n+doped regions (11) are formed in corresponding relation to and only under channel regions (CH1a-CH1d) of structures (200a-200d), respectively. This lowers the effective concentration of the p+semiconductor layer (12) on the n+doped regions (11) to reduce the number of holes injected from a collector layer (9) in an off state, reducing a leakage current.
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Baumeister B. William
Farahani Dana
Mitsubishi Denki & Kabushiki Kaisha
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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