Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-12-08
1999-11-09
Do, Diep N.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324520, 324536, G01R 3112, G01R 3108
Patent
active
059821817
ABSTRACT:
An insulated device diagnosing system is capable of judging the deterioration, lifetime, and defects of a device. The intensity at each voltage phase angle is measured at a plurality of specific frequencies, taking high voltage phase angles as the abscissas. The deterioration, lifetime, and the kind and extent of abnormality of the device are judged from the pattern and intensity of the spectral distribution, which is obtained by peak-holding the measured intensity for a defined time period. According to the present invention, partial discharge can be measured highly sensitively and precisely to diagnose the deterioration, lifetime and the extent of defect of the device. As a result, the insulation reliability of the device can be improved, and the part of the device that should be repaired/replaced can be grasped before disassembly of the device, thereby cutting the maintenance cost.
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Endo Fumihiro
Rokunohe Toshiaki
Shinohara Ryouichi
Yamagiwa Tokio
Do Diep N.
Hitachi , Ltd.
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