Instrument to measure fluorescence which has occurred in a sampl

Details Instrument to measure fluorescence which has occurred in a sampl Instrument to measure fluorescence which has occurred in a sampl

1986-02-18

1988-02-09

Fields, Carolyn E.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378119, 378 45, G01N 23223

Patent

active

047245360

ABSTRACT:
An instrument measures fluorescence which has occurred in a sample stimulated by X rays. The instrument consists of a laser device, an X-ray pulse generation tube excited by the laser pulse from the laser device, a light sensor for detecting fluorescence in the sample, a reference timing pulse generator, a time-to-voltage converter to indicate the time of fluorescence and a multichannel analyzer to sum the frequency of times that the designated voltage is issued from the time-to-voltage converter in each voltage level during measurement.

REFERENCES:
patent: 3991309 (1976-11-01), Hauer
patent: 4435828 (1984-03-01), Epstein et al.
Review of Scientific Instruments, vol. 56, No. 6, Jun. 1985, pp. 1187-1194.
Forsyth, J. M. and Frankel, R. D.; "Experimental Facility for Nanosecond Time-Resolved, Low Angle X-Ray Diffraction Experiments Using a Laser-Produced Plasma Source"; Rev. Sci. Instrum. 55 (8), Aug. 1984; pp. 1235-1242.
Bialkowski, J. and Schoeps, W., "Constant Fraction Discriminator with Automatic Adjustment of Optimal Triggering Level and Automatic Suppression of AC and DC Input Interference Signals"; Nuclear Instru. & Methods in Physics Research, 228 (1984) pp. 110-117.
Okano, K., Nakagome, Y., Kawase, Y., Uehara, S., Nakano, Y., Kanda, K., and Shibata, T.; "An Automatic Irradiation Apparatus with On-Line Measurement System for the Study of Short-Lived Activities", Nuclear Instruments and Methods, 104 (1972) pp. 13-19.

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