Instrument having X-ray fluorescence and spark emission...

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Reexamination Certificate

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C378S045000

Reexamination Certificate

active

07430273

ABSTRACT:
An analytical instrument is disclosed having both XRF and spark emission spectroscopy capabilities. In a particularly advantageous embodiment, a field portable XRF device is removably coupled to the instrument by means of a docking station. A first surface of the sample is irradiated with an X-ray beam, and the X-ray radiation fluorescently emitted from the sample is detected and analyzed to acquire elemental composition data. The instrument is further provided with a spark source located proximal a second surface of the sample and a detector for sensing the radiation emitted from the spark-excited material. The combined instrument enables the acquisition of complementary elemental composition data by XRF and spark emission spectroscopy without having to transport a sample between separate instruments.

REFERENCES:
patent: 4592655 (1986-06-01), Slickers
patent: 5406608 (1995-04-01), Yellepeddi et al.
patent: 6765986 (2004-07-01), Grodzins et al.
patent: 6801595 (2004-10-01), Grodzins et al.
patent: 1724570 (2006-11-01), None

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