X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Patent
1988-11-28
1990-06-19
Church, Craig E.
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
378 98, G01D 1800
Patent
active
049359509
ABSTRACT:
An instrument for measuring the characteristics of an x-ray unit includes two pairs of photo detectors to measure the kVp of the x-ray beam, a single photo detector to measure the relative film exposure produced by the beam and another single photo detector used to measure the relative current in milliamps (mA) of the x-ray unit. The instrument multiplexes the signals and converts them to digital form for storage and analysis by a microprocessor. The output is a display the contents of which is user selectable either by a switch panel or through use of a remote control unit.
REFERENCES:
patent: 4355230 (1982-10-01), Wilson
patent: 4697280 (1987-09-01), Zarnstorff et al.
patent: 4843619 (1989-06-01), Sheridan
Model 6000A Nero.
Model 6000B Nero.
The Nero 6000B Makes X-Ray Machine Performance Studies as Easy as Possible.
BlockDiagram Digi-X.
Digi-X Plus Announcement in Second Source Apr./May 1988.
Rothenberg & Fleischman, Extensive Evaluation of Commercially Available Non-Invasive Electronic kVp Measurement devices, 8 1-5, '82.
Campbell, Yaffo & Taylor, Measurement of Time Variations of X-Ray Beam Characteristics.
Photon Physics KV Measuring Instrument.
Digi-X-Plus.
How Would You Picture The Ultimate X-Ray Meter?
Victoreen 6000A Nero Noninvasive X-Ray Evaluation System.
DeWerd Larry A.
Muehlenkamp Joseph
Ranallo Frank N.
Church Craig E.
Radiation Measurements, Inc.
LandOfFree
Instrument for the measurement of x-ray beam characteristics does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Instrument for the measurement of x-ray beam characteristics, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Instrument for the measurement of x-ray beam characteristics will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2264953