Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1991-09-10
1995-04-11
Nguyen, Vinh
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324 96, G01R 3128
Patent
active
054062136
ABSTRACT:
An instrument for testing defects on active matrix liquid crystal display base plates used for liquid crystal display panels. The instrument includes a testing device having an electro-optical element and active matrix liquid crystal display base plate, a light source for emitting light to said base plate, a light guide for guiding light perpendicular to said electro-optical element, and a photo-receiver for receiving light reflected from the electro-optical element. The lighting device has a halogen light, a filter, and other elements, and the electro-optical element is equipped with an optically reflective part made of a dielectric multi-layer coating. The light guide has a translucent mirror incorporated inside a transparent vessel and is positioned at an angle with respect to the optical axis. The instrument can also detect various defects in active matrix liquid crystal display base plates with high accuracy.
REFERENCES:
patent: 3889053 (1975-06-01), Lloyd et al.
patent: 3992663 (1976-11-01), Seddick
patent: 4368523 (1983-01-01), Kawate
patent: 4507605 (1985-03-01), Geisel
patent: 4523847 (1985-06-01), Bjorklund et al.
patent: 4542333 (1985-09-01), Koontz
patent: 4618819 (1986-10-01), Mourou et al.
patent: 4631576 (1986-12-01), St. John
patent: 4633242 (1986-12-01), Sekiya
patent: 4688900 (1987-08-01), Doane et al.
patent: 4758092 (1988-07-01), Heinrich et al.
patent: 4825201 (1989-08-01), Watanabe et al.
patent: 4855591 (1989-08-01), Nakamura et al.
patent: 4862075 (1989-08-01), Choi et al.
patent: 4870357 (1989-09-01), Young et al.
patent: 4875006 (1989-10-01), Henley et al.
patent: 4906922 (1990-06-01), Takahashi et al.
patent: 4910458 (1990-03-01), Forsyth et al.
patent: 4944576 (1990-07-01), Lacker et al.
patent: 4983911 (1991-01-01), Henley
patent: 5274325 (1993-12-01), Shinagawa et al.
Testing and Qualifications of A-Si TFT-LC Color Cells for Military Avionics Applications; F. C. Luo et al.; SID 90 Digest; pp. 194-196.
Hitachi LCD Advertisement; pp. 2 and 3.
Measurement of Electro-Optic Characteristics of LCDs; M. E. Becker et al.; SID 90 Digest; pp. 163-166.
In-Process Testing of Thin Film Transistor Arrays; R. Wisnieff et al.; SID 90 Digest pp. 190-193.
NCAP Displays: Optical Switching and Dielectric Properties; L. Welsh et al.; SID 90 Digest; pp. 220-223.
Nguyen Vinh
Photon Dynamics, Inc.
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