Instrument for measuring flatness or uniformity of curvature

Geometrical instruments – Gauge – Straightness – flatness – or alignment

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

33285, 33 1N, 33DIG21, 3350104, G01B 1124

Patent

active

052690709

ABSTRACT:
An instrument for determining the profile of a surface. Two hinge plates are attached to each other at a hinge joint. A collimated light source on one of the hinge plates produces a spot on a position sensitive photo detector on the other hinge plate. An electrical circuit is provided to produce an electrical signal based on the relative position of the spot as the instrument flexes as it is slid along the surface. In preferred embodiments the electrical signal is a measure of the surface profile or the change in slope of the profile.

REFERENCES:
patent: 4434558 (1984-03-01), Face, Jr. et al.
patent: 4589773 (1986-05-01), Ido et al.
patent: 4818173 (1989-04-01), Khusro
patent: 4897927 (1990-02-01), Nicol
patent: 4904081 (1990-02-01), Miyahara
patent: 5052800 (1991-10-01), Mimmack et al.
W. E. Goetz et al., "Triaxial Optical Angular Measuring System" IBM Technical Disclosure Bulletin, vol. 15 No. 3, Aug. 1972.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Instrument for measuring flatness or uniformity of curvature does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Instrument for measuring flatness or uniformity of curvature, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Instrument for measuring flatness or uniformity of curvature will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1695380

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.