Instrument for determining the radiation parameters of a focused

Details Instrument for determining the radiation parameters of a focused Instrument for determining the radiation parameters of a focused

1978-11-24

1980-11-11

Anderson, Bruce C.

Radiant energy

With charged particle beam deflection or focussing

With detector

250398, 250492B, 219121EB, G01K 108

Patent

active

042335159

ABSTRACT:
Method and device for determining the radiation parameters of a focused beam of charged particles guided periodically over a target surface, especially in an electron beam melting and vaporizing system wherein the target is the surface of a melt. At least one probe is positioned in front of the target surface in the direction of radiation and within the beam trace, the probe being connected to an electrical display device. The output signal of the probe is displayed via a cathode ray tube and the reversal point of the charged-particle beam is determined on the basis of the time interval between the signal peaks in conjunction with the velocity of the beam movement.

REFERENCES:
patent: 3547074 (1970-12-01), Hirschfeld
patent: 3699304 (1972-10-01), Baldwin et al.
patent: 3699439 (1972-10-01), Turner
patent: 3784909 (1974-01-01), Schutt
patent: 3864597 (1975-02-01), Trotel

Affiliated with

Also associated with

Rating

Instrument for determining the radiation parameters of a focused does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Instrument for determining the radiation parameters of a focused, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Instrument for determining the radiation parameters of a focused will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1693288