Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1998-03-30
2000-09-12
Pham, Hoa Q.
Optics: measuring and testing
By particle light scattering
With photocell detection
356340, 356343, G01N 2100
Patent
active
061185329
ABSTRACT:
The present invention relates to an instrument for determining the light scattered by a sample comprising a platform rotatable about an axis of rotation; a sample holder disposed along the axis of rotation; a light source for producing a beam of coherent light that can be focused on a sample in the sample holder; and a plurality of detectors disposed and rotatable about the axis of rotation and adapted so that each detector can be adjusted to focus on a common point along the axis of rotation by reference to the beam.
REFERENCES:
patent: 4779003 (1988-10-01), Tatsuno
patent: 5120978 (1992-06-01), Yamashita et al.
patent: 5129723 (1992-07-01), Howie et al.
patent: 5135302 (1992-08-01), Hirako
patent: 5155543 (1992-10-01), Hirako
patent: 5280272 (1994-01-01), Nagashima et al.
patent: 5710625 (1998-01-01), Neumann et al.
ALV-Laser Vertriebsgesellschaft mbH
Pham Hoa Q.
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