Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2002-06-19
2010-10-19
Shah, Kamini S (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07818157
ABSTRACT:
A method for analyzing an electrical characteristic of wire segments configured as one or more power meshes in an integrated circuit (IC) core comprising the steps of (A) specifying design information corresponding to the power meshes, (B) specifying at least one type of analysis to be performed, where the analysis comprises (i) generating a file corresponding to the IC core in a format compatible with an electronic circuit simulator and (ii) calculating the electrical characteristic of the wire segments via the circuit simulator, and (C) displaying the calculated electrical characteristic.
REFERENCES:
patent: 5404310 (1995-04-01), Mitsuhashi
patent: 5446676 (1995-08-01), Huang et al.
patent: 5648910 (1997-07-01), Ito
patent: 5872952 (1999-02-01), Tuan et al.
patent: 6311147 (2001-10-01), Tuan et al.
patent: 6523154 (2003-02-01), Cohn et al.
patent: 6675139 (2004-01-01), Jetton et al.
patent: 6895372 (2005-05-01), Knebel et al.
patent: 6900544 (2005-05-01), Boireau
patent: 7016794 (2006-03-01), Schultz
patent: 2002/0087940 (2002-07-01), Greidinger et al.
Altera, Minimizing Ground Bounce & Vcc Sag, Nov. 2001, ver 1.0.
Oh et al. “Multi-pad Power/Ground Network Design for Uniform Distribution of Ground Bounce”, 1998, ACM, DAC '98, pp. 287-290.
Neamen, Electronic Circuit Analysis and Design, 2ndEdition, 2001, Ch 10, 16 pgs.
Banerjee et al., “Coupled Analysis of Electromigration Reliability and Performance in ULSI Signal Nets”, Proc. of 2001 IEEE/ACM international conference on Computer-aided design, IEEE, 2001, 8 pages.
Richard T. Schultz, “Floor Plan Development Electromigration and Voltage Drop Analysis Tool”, U.S. Appl. No. 09/268,902, Filed Mar. 16, 1999.
Lo Suzanne
LS1 Corporation
Maiorana PC Christopher P.
Shah Kamini S
LandOfFree
Instantaneous voltage drop sensitivity analysis tool (IVDSAT) does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Instantaneous voltage drop sensitivity analysis tool (IVDSAT), we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Instantaneous voltage drop sensitivity analysis tool (IVDSAT) will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4179945