Instantaneous polarization measurement system and method

Optics: measuring and testing – By polarized light examination

Reexamination Certificate

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Reexamination Certificate

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07079247

ABSTRACT:
The invention provides a highly sensitive measurement of retardance and slow axis orientation, accurately and instantaneously, across a full two-dimensional image. There are no moving parts and there need not be any electro-optic tuning as part of the measurement. It is ideally adapted to real-time imaging and is well-suited to use with biological and medical samples, including visualizing structures in oocytes. The invention splits a light beam into several beams, which are analyzed using elliptical polarizers and the resultant intensity is measured. It can be constructed using a single pixilated detector, or several detectors, to achieve high spatial resolution when this is desired.

REFERENCES:
patent: 5596406 (1997-01-01), Rosencwaig et al.
patent: 5788632 (1998-08-01), Pezzaniti et al.
patent: 5865520 (1999-02-01), Kavanagh et al.
patent: 6501548 (2002-12-01), Oldenbourg
patent: 6563582 (2003-05-01), Chun
patent: 2002/0091323 (2002-07-01), Dreher

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