Inspection unit and method of manufacturing substrate

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

active

06894515

ABSTRACT:
The present invention provides an inspection unit capable of allowing a probe and other components to be positioned with a high degree of accuracy while preventing misalignment of the probe and to be arranged closer to each other. The inspection unit includes a probe14afor supplying an inspection signal in contact with a circuit wiring, and a board12having an electrode13printed thereon to detect the supplied inspection signal to the circuit wiring in non-contact with the circuit wiring. The board12includes a bore12aallowing the probe14ato be penetratingly disposed therein. The bore12ais adapted to guide the axial movement of the probe14a. A circuit wiring having branch portions branched halfway therefrom can be inspected by using a less number of non-contact sensors.

REFERENCES:
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patent: 5426372 (1995-06-01), Freve
patent: 5631572 (1997-05-01), Sheen et al.
patent: 6097203 (2000-08-01), Parker et al.
patent: 6353327 (2002-03-01), Nishikawa
patent: 6630832 (2003-10-01), Harzanu et al.
patent: 5-60789 (1993-03-01), None
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patent: 7-167906 (1995-07-01), None
patent: 10-282179 (1998-10-01), None
patent: 2000-91391 (2000-03-01), None
patent: 2000-100495 (2000-04-01), None
patent: 2000-227441 (2000-08-01), None

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