Inspection systems and methods

Details Inspection systems and methods Inspection systems and methods

2008-01-29

2008-01-29

Bali, Vikkram (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S146000, C382S149000

Reexamination Certificate

active

07324685

ABSTRACT:
In one embodiment, a system comprises logic configured to identify a tip of a pin that has been press fit into a circuit board, logic configured to measure characteristics that pertain to a flat end surface and a chamfered surface of the identified pin tip, logic configured to compare the measured characteristics with at least one of stored reference values and each other, and logic configured to make a final decision as to whether the pin is properly installed based upon results of the comparing performed by the logic configured to compare.

REFERENCES:
patent: 5924192 (1999-07-01), Wuyts
patent: 6098275 (2000-08-01), Wuyts et al.
patent: 2001-280935 (2001-10-01), None

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