Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2006-09-26
2006-09-26
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C438S017000, C438S149000
Reexamination Certificate
active
07112952
ABSTRACT:
The present invention provides an inspection system of ID chips that can supply a signal or power supply voltage to an ID chip without contact, and can increase throughput of an inspection process and an inspection method using the inspection system. The inspection system according to the present invention includes a plurality of inspection electrodes, a plurality of inspection antennas, a position control unit, a unit for applying voltage to each of the inspection antennas, and a unit for measuring potentials of the inspection electrodes. One feature of the inspection system is that a plurality of ID chips and the plurality of inspection electrodes are overlapped with a certain space therebetween, and the plurality of ID chips and the plurality of inspection antennas are overlapped with a certain space therebetween, and the plurality of ID chips are interposed between the plurality of inspection electrodes and the plurality of inspection antennas by the position control unit.
REFERENCES:
patent: 5428521 (1995-06-01), Kigawa et al.
patent: 5854492 (1998-12-01), Chinone et al.
patent: 6218219 (2001-04-01), Yamazaki et al.
patent: 6509217 (2003-01-01), Reddy
patent: 6919215 (2005-07-01), Yamazaki et al.
patent: 2002/0130675 (2002-09-01), Hiroki
patent: 2002/0132383 (2002-09-01), Hiroki et al.
patent: 2002/0173060 (2002-11-01), Hiroki
patent: 1387246 (2002-12-01), None
patent: 2003-107136 (2003-04-01), None
English language specification of Chinese Patent Application No. CN 1387246 A.
Akiba Mai
Arai Yasuyuki
Tachimura Yuko
Cook Alex McFarron Manzo Cummings & Mehler, Ltd.
Patel Paresh
Semiconductor Energy Laboratory Co,. Ltd.
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