Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-04-12
2011-04-12
Mehta, Bhavesh M (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S145000, C382S199000, C702S150000
Reexamination Certificate
active
07925075
ABSTRACT:
A method for inspecting a feature of a part is provided. The method includes obtaining a profile corresponding to the feature using a sensor and projecting the profile onto a compensation plane normal to the feature for generating an updated profile. The method also includes using the updated profile for reducing a measurement error caused by an orientation of the sensor. An inspection system is also provided. The inspection system includes a sensor configured to capture a fringe image of a feature on a part. The inspection system further includes a processor configured to process the fringe image to obtain an initial profile of the feature and to project the initial profile onto a compensation plane normal to the feature.
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Abramovich Gil
Harding Kevin George
Isaacs Ralph Gerald
Jia Ming
Ning Yu
Clarke Penny A.
General Electric Company
Mehta Bhavesh M
Thomas Mia M
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