Inspection probe, method for preparing the same, and method...

Details Inspection probe, method for preparing the same, and method... Inspection probe, method for preparing the same, and method...

2007-05-15

2007-05-15

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

11074243

ABSTRACT:
An inspection probe comprises resilient probe pins having electric contacts disposed in positions corresponding to electrodes of an external terminal of a semiconductor device, a base substrate including pitch-expansion wiring layers of the probe pins, and a backup substrate, the base substrate, and a flexible substrate, wherein at least one precious metal layer is disposed at the tip of the probe pins on the side having the electric contact for contacting the electrodes of the semiconductor device to be inspected, at least one metal layer is disposed on the probe pins and the pitch-expansion wiring layers, the precious metal layer and the metal layer are composed of the same material or composed of different materials, and a roughness pattern comprising fine marks is provided on the surfaces of the probe pins on the side having the electric contacts for contacting the electrodes of the semiconductor device to be inspected.

REFERENCES:
patent: 4636722 (1987-01-01), Ardezzone
patent: 5773987 (1998-06-01), Montoya
patent: 6633176 (2003-10-01), Takemoto et al.
patent: 2003/0214038 (2003-11-01), Nemoto
patent: 5-198636 (1993-08-01), None
patent: 6-140482 (1994-05-01), None
patent: 6-324081 (1994-11-01), None
patent: 6-331655 (1994-12-01), None
patent: 6-334005 (1994-12-01), None
patent: 6-334006 (1994-12-01), None
patent: 10-38918 (1998-02-01), None
patent: 2002-257859 (2002-09-01), None
patent: 2002-286755 (2002-10-01), None
patent: 2002-286758 (2002-10-01), None
patent: 2003-121466 (2003-04-01), None
patent: 2003-185674 (2003-07-01), None
patent: 2003-207521 (2003-07-01), None
patent: 2003-322664 (2003-11-01), None

Affiliated with

Also associated with

Rating

Inspection probe, method for preparing the same, and method... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspection probe, method for preparing the same, and method..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection probe, method for preparing the same, and method... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3817682