Inspection of common materials for radiation exposure by...

Details Inspection of common materials for radiation exposure by... Inspection of common materials for radiation exposure by...

2006-05-09

2006-05-09

Hannaher, Constantine (Department: 2878)

Radiant energy

Invisible radiation responsive nonelectric signalling

Methods

Reexamination Certificate

active

07041987

ABSTRACT:
A method of detecting a defect on a surface of a material due to exposure of the material to incident ionizing radiation, the method comprising the step of:inspecting a solid material having an atomically flat surface by at least an Atomic Force Microscope (AFM) or a Magnetic Force Microscope (MFM) for a defect in atomic structure on said surface due to exposure to ionizing radiation.

REFERENCES:
patent: 6466895 (2002-10-01), Harvey et al.
patent: 6538730 (2003-03-01), Vaez-Iravani et al.
Robert L. Fleischer, “Serendipitous Radiation Monitors”, American Scientist, vol. 90, pp. 324-331, Jul.-Aug. 2002.
Michael A. Levi and Henry C. Kelly, “Weapons of Mass Disruption”, Scientific American, pp. 77-81, Nov. 2002.

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