Inspection method using templates images, unique histogram analy

Details Inspection method using templates images, unique histogram analy Inspection method using templates images, unique histogram analy

1992-07-07

1996-01-02

Couso, Yon J.

Image analysis

Applications

Manufacturing or product inspection

382217, 348 92, G06K 900

Patent

active

054816190

ABSTRACT:
A technique for detecting defects in stationary products or in products moving on a production line (102, FIG. 1) by analyzing their images uses a matrix or line-scan camera (104, FIG. 1) for taking images of products (102). The product's dimensions are measured with accuracy and the sizes and positions of their surface defects are determined. The technique is much faster and more accurate than current techniques and is based on an analysis of the histogram vectors of the full image (FIG. 5). A carefully selected template image (A1, FIG. 2) composed of templates (B1, FIG. 2) is created and saved in the memory of a computer (106, FIG. 1). The method also includes the steps of creating and saving a histogram vector of the template image loading Look-Up Tables with a shifting and quantizing function for the image gray levels saving a product image in memory to be superposed onto template image (FIG. 1) creating and saving a histogram vector of the result unit superposed image and analyzing the resulting histograms, i.e., finding discontinuations, changes the values of gray levels, appearance of new gray levels, etc. This results in the detection of product dimensions or surface defects and further allows deciphering of product codes.

REFERENCES:
patent: 4429414 (1984-01-01), Asakawa
patent: 4637054 (1987-01-01), Hashim
patent: 5007096 (1991-04-01), Yoshida
patent: 5052044 (1991-09-01), Gaborski
patent: 5136661 (1992-08-01), Kobayashi
patent: 5204911 (1993-04-01), Schwartz et al.

Affiliated with

Also associated with

Rating

Inspection method using templates images, unique histogram analy does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspection method using templates images, unique histogram analy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection method using templates images, unique histogram analy will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-242159