Inspection method, inspection apparatus and...

Details Inspection method, inspection apparatus and... Inspection method, inspection apparatus and...

2007-12-20

2009-12-15

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S761010

Reexamination Certificate

active

07633309

ABSTRACT:
An inspection apparatus includes a fritting circuit applying a voltage between a probe pair composed of probes in pairs in contact with a substrate to cause a fritting phenomenon to establish electrical conduction between the probes and the substrate; and a switching circuit electrically connecting the probe pair and the flitting circuit and capable of freely switching between polarities of a voltage applied between the probe pair. Voltage is applied twice between the probe pair in contact with the substrate to thereby perform fritting twice. In the two times of fritting, the polarities of the voltage applied between the probe pair are changed.

REFERENCES:
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patent: 7301357 (2007-11-01), Shinozaki et al.
patent: 2007/0063725 (2007-03-01), Komatsu et al.
patent: 2002-139542 (2002-05-01), None
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patent: 2004-93451 (2004-03-01), None
patent: 2004-191208 (2004-07-01), None

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