Inspection method and inspection system of surface of article

Details Inspection method and inspection system of surface of article Inspection method and inspection system of surface of article

2006-03-14

2006-03-14

Lauchman, Layla G. (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Reexamination Certificate

active

07012679

ABSTRACT:
The present invention is a method for inspecting a surface of an article through an image thereof by photographing a surface to be inspected of the article with a CCD camera, in which the surface of the article is inspected by selecting two arbitrary pixels from among pixels showing the surface to be inspected in the image and comparing the two pixels. When the two pixels are selected, for example, pixels in point-symmetry or line symmetry can be selected. Further, the two selected pixels are compared, for example, in brightness.

REFERENCES:
patent: 4467350 (1984-08-01), Miller
patent: 4487322 (1984-12-01), Juvinall
patent: 5754678 (1998-05-01), Hawthorne et al.
patent: 6021380 (2000-02-01), Fredriksen et al.
patent: 2277855 (2001-01-01), None
patent: 1177733 (1998-04-01), None

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