Inspection method and inspection equipment

Details Inspection method and inspection equipment Inspection method and inspection equipment

2007-11-27

2007-11-27

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S765010

Reexamination Certificate

active

10538785

ABSTRACT:
In an inspection method according to the invention, a plurality of drivers21incorporated in a tester20apply a fritting voltage to respective electrodes P via first probe pins11A included in pairs of first and second probe pins11A and11B and connected to the respective drivers.

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patent: 6462572 (2002-10-01), Takahashi
patent: 6529011 (2003-03-01), Okubo
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patent: 6788090 (2004-09-01), Aihara
patent: 6897666 (2005-05-01), Swettlen et al.
patent: 1 182 460 (2002-02-01), None
patent: 10-010200 (1998-01-01), None

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