Inspection method, and inspection device, and manufacturing...

Details Inspection method, and inspection device, and manufacturing... Inspection method, and inspection device, and manufacturing...

2002-02-28

2008-08-12

Chawan, Sheela C (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S149000, C324S701000, C345S087000, C345S904000, C250S581000, C348S180000, C427S157000

Reexamination Certificate

active

07412088

ABSTRACT:
A method of inspecting a display panel having a substrate and a plurality of fluorescent layers including measuring bright and dark signals reflected by the fluorescent layers while moving the substrate or an illuminating means generating the signals and an imaging means receiving the signals in a direction across the plurality of fluorescent layers at predetermined intervals, and measuring an application volume for each fluorescent layer from the signals obtained by the imaging means.

REFERENCES:
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patent: 5707549 (1998-01-01), Matsukiyo et al.
patent: 6129827 (2000-10-01), Nakazawa et al.
patent: 6656608 (2003-12-01), Kita et al.
patent: 6831995 (2004-12-01), Asano et al.
patent: 2002/0009536 (2002-01-01), Iguchi et al.
patent: 2002/0024498 (2002-02-01), Vos et al.

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