Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2006-03-14
2006-03-14
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
C356S337000, C073S040700
Reexamination Certificate
active
07012678
ABSTRACT:
An inspection method for detecting a defect in a test object. A particulate is generated, then the generated particulate is introduced into a test object. Subsequently, light having high directivity is emitted such that the light passes in the vicinity of the test object to irradiate the particulate discharged from the test object, thereby making the particulate visible. An inspection apparatus for detecting a defect in a test object, including a particulate generator, a particulate introducing device which introduces the particulate into a test object, and a high directional light emitter emitting light passing in the vicinity of the test object and irradiating the particulate discharged from the test object to visualize the particulate. The inspection method and apparatus can detect a defect with high sensitivity and shorten an inspection time and a post-treatment time.
REFERENCES:
patent: 5411682 (1995-05-01), Nagashima
patent: 5640236 (1997-06-01), Nagashima
patent: A 4-104038 (1992-04-01), None
patent: A 6-134268 (1994-05-01), None
patent: A 7-174660 (1995-07-01), None
patent: A-2000-193582 (2000-07-01), None
Enomoto Akio
Miyashita Kouichi
NGK Insulators Ltd.
Oliff & Berridg,e PLC
Stafira Michael P.
Valentin II Juan D
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