Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2008-03-04
2008-03-04
Chawan, Sheela (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S149000, C250S22300B, C209S524000, C356S239400
Reexamination Certificate
active
10220098
ABSTRACT:
An inspection device and a method of checking on correct functioning of the inspection process of containers such as bottles, cans or the like, where a container to be inspected is detected optically at least in part, and the image data thus detected is analyzed with an analysis program to detect defective containers. An especially simple and reproducible function test of the analysis program is made possible by the fact that reference image data is input into the analysis program, this reference image data corresponding structurally to the detected image data and being analyzed by the analysis program with the same parameter settings of the analysis program.
REFERENCES:
patent: 4651879 (1987-03-01), Harris et al.
patent: 4924107 (1990-05-01), Tucker
patent: 5045688 (1991-09-01), Domenico et al.
patent: 5067616 (1991-11-01), Plester et al.
patent: 5095204 (1992-03-01), Novini
patent: 5245399 (1993-09-01), Wertz et al.
patent: 5523560 (1996-06-01), Manique et al.
patent: 6067155 (2000-05-01), Ringlien
patent: 6433338 (2002-08-01), Nordbryhn et al.
patent: 6466691 (2002-10-01), Heuft
patent: 2166235 (1972-11-01), None
patent: 3324449 (1983-07-01), None
patent: 3330817 (1985-03-01), None
patent: 4239203 (1993-12-01), None
patent: 29910452 (1994-09-01), None
patent: 19624552 (1998-01-01), None
patent: 19646678 (1998-05-01), None
patent: 19646694 (1998-05-01), None
patent: 4302656 (1999-06-01), None
patent: 10-300682 (1998-11-01), None
patent: 11-170489 (1999-06-01), None
patent: 2000-194858 (2000-07-01), None
Chawan Sheela
Krones AG
Marshall & Gerstein & Borun LLP
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