Inspection method and apparatus, lithographic apparatus,...

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Reexamination Certificate

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C356S237200

Reexamination Certificate

active

07852459

ABSTRACT:
A scatterometer has a radiation source capable of emitting radiation in distinct first and second wavelength ranges. An adjustable optical element is provided to effect a chromatic correction as necessary according to which wavelength range is in use. A single scatterometer can thereby effect measurements using widely separated wavelengths.

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Notice of Reasons for Rejection mailed Sep. 1, 2010 for Japanese Patent Application No. 2008-139438, 3 pgs.

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