Inspection method and apparatus for EL array substrate

Details Inspection method and apparatus for EL array substrate Inspection method and apparatus for EL array substrate

2005-08-16

2005-08-16

Hollington, Jermele M. (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

Reexamination Certificate

active

06930505

ABSTRACT:
To provide an inspection method for an EL array substrate that can detect a failure on the EL array substrate before assembling an EL panel. By giving a prescribed potential to a data line6to turn on a switching transistor4for a prescribed time, a holding capacitor3and a parasitic capacitor8are charged. By turning on again the switching transistor4after a lapse of a prescribed time from turning-off of the switching transistor4and by connecting the data line6to an integrator10, the holding capacitor3and the parasitic capacitor8are discharged, and a discharged amount of charge is detected by the integrator10. Based on this amount of charge, a failure on an EL array substrate is detected before assembling an EL panel.

REFERENCES:
patent: 4984202 (1991-01-01), Kawahara et al.
patent: 5428300 (1995-06-01), Takahashi et al.
patent: 5608558 (1997-03-01), Katsumi
patent: 5994916 (1999-11-01), Hayashi
patent: 2003/0184334 (2003-10-01), Matsunaga et al.
patent: 2001195033 (2001-07-01), None
patent: 2001195034 (2001-07-01), None
patent: PUPA 2002-032035 (2002-01-01), None
patent: PUPA 2003-228299 (2003-08-01), None
English Abstract PUPA 2002-032035, Jan. 31, 2002, Japan.
English Abstract PUPA 2003-228299, Aug, 15, 2003, Japan.

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