Inspection method

Image analysis – Applications – Manufacturing or product inspection

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

382199, G06K 900

Patent

active

059265574

ABSTRACT:
An inspection system and method uses a ring illumination apparatus to illuminate one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The ring illumination apparatus includes a substantially ring-shaped light source that provides a substantially even illumination across the one or more reflective elements. An illumination detection device detects light beams reflecting off of the illuminated reflective elements for forming a reflected image. A method of processing the reflected image includes locating one or more points on each reflected image element representing an illuminated reflective element. The points on the reflected image elements are used to located the pattern of the reflected image elements and/or to fit an outline around each image element corresponding to a known percentage of the true dimensions of each solder ball or other reflective element. The inspection system and method thereby determines various characteristics such as the absence/presence, location, pitch, size and shape of each reflective element.

REFERENCES:
patent: 4028728 (1977-06-01), Sharp
patent: 4677473 (1987-06-01), Okamoto et al.
patent: 4688935 (1987-08-01), Barnes et al.
patent: 4688939 (1987-08-01), Ray
patent: 4695157 (1987-09-01), Schoenbaum et al.
patent: 4697076 (1987-09-01), Yoshida
patent: 4972093 (1990-11-01), Cochran et al.
patent: 4988202 (1991-01-01), Nayar et al.
patent: 5015097 (1991-05-01), Nomoto et al.
patent: 5023916 (1991-06-01), Breu
patent: 5030008 (1991-07-01), Scott et al.
patent: 5039868 (1991-08-01), Kobayashi et al.
patent: 5048094 (1991-09-01), Aoyama et al.
patent: 5051872 (1991-09-01), Anderson
patent: 5058178 (1991-10-01), Ray
patent: 5064291 (1991-11-01), Reiser
patent: 5072127 (1991-12-01), Cochran et al.
patent: 5097516 (1992-03-01), Amir
patent: 5115475 (1992-05-01), Lebeau
patent: 5118193 (1992-06-01), Brown et al.
patent: 5127727 (1992-07-01), Arnold et al.
patent: 5137362 (1992-08-01), LeBeau
patent: 5166985 (1992-11-01), Takagi et al.
patent: 5185811 (1993-02-01), Beers et al.
patent: 5245671 (1993-09-01), Kobayashi et al.
patent: 5247344 (1993-09-01), Doan
patent: 5257714 (1993-11-01), Beers et al.
patent: 5267217 (1993-11-01), Tokura et al.
patent: 5302836 (1994-04-01), Siu
patent: 5394246 (1995-02-01), Sugawara
patent: 5406372 (1995-04-01), Vodanovic et al.
patent: 5418879 (1995-05-01), Kalnajs et al.
patent: 5420689 (1995-05-01), Siu
patent: 5424838 (1995-06-01), Siu
patent: 5440391 (1995-08-01), Smeyers et al.
patent: 5461417 (1995-10-01), White et al.
patent: 5495424 (1996-02-01), Tokura
patent: 5519496 (1996-05-01), Borgert et al.
patent: 5533146 (1996-07-01), Iwai
patent: 5539485 (1996-07-01), White
patent: 5574801 (1996-11-01), Collet-Beillon
patent: 5581632 (1996-12-01), Koljonen et al.
patent: 5598345 (1997-01-01), Tokura
patent: 5604550 (1997-02-01), White
patent: 5692061 (1997-11-01), Sasada et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Inspection method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspection method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1329481

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.