Inspection device of a semiconductor device

Details Inspection device of a semiconductor device Inspection device of a semiconductor device

2006-04-12

2009-02-24

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07495464

ABSTRACT:
An inspection device of a semiconductor device includes a socket where the semiconductor device is installed, and a measuring part configured to inspect an electrical property of the semiconductor device. A standard sample and the socket are provided in a body. A standard value of the standard sample is stored in the measuring part. Whether there is abnormality of the measuring part is determined by comparing a value of the standard sample measured by the measuring part and the standard value.

REFERENCES:
patent: 5534786 (1996-07-01), Kaneko et al.
patent: 5794175 (1998-08-01), Conner
patent: 6323669 (2001-11-01), Kang
patent: 6452411 (2002-09-01), Miller et al.
patent: 6499121 (2002-12-01), Roy et al.
patent: 6747473 (2004-06-01), Cowan
patent: 7138792 (2006-11-01), Fu et al.
patent: 5-322971 (1993-12-01), None
patent: 6-148269 (1994-05-01), None

Affiliated with

Also associated with

Rating

Inspection device of a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspection device of a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection device of a semiconductor device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4068893