Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2002-11-15
2003-06-10
Cuneo, Kamand (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010, C324S764010, C439S264000
Reexamination Certificate
active
06577151
ABSTRACT:
BACKGROUND OF THE INVENTION
(a) Technical Field of the Invention
The present invention relates to an inspection device for wiring of an integrated circuit, and in particular, an inspection device which can be easily fabricated and provides accuracy in inspection of ICs.
(b) Description of the Prior Art
Referring to
FIG. 1
, there is shown an integrated circuit
10
fixed to a base board
11
and a plurality of wires
12
connected the base board
11
to the integrated circuit
10
(IC). A plastic package is used to from into a plastic housing
13
, thereby the IC connected to the base board
11
and provides its functions. Due to the sizes of the electronic appliances, the wiring
12
of an integrated circuit
10
may be exposed to the outer surface of the plastic housing
13
and become damaged. Therefore, it is a need to select the good wiring of the integrated circuit
10
prior to its application. Referring to
FIGS. 2 and 3
, the conventional inspection device comprises a seat body
20
and a top cover
30
, and the top end face of the seat body
20
is provided with cavity
21
of an appropriate depth. The two lateral side of the cavity
21
are withholding protruded edge
22
and the two lateral sides of the end face on the seat body
20
is provided with a plurality of positioning pegs
23
. The top cover
30
has a hollow region
31
which is corresponding to the cavity slot
21
of the end face of the seat body
20
. The two interior sides of the hollow region
31
are provided with grooves
32
and the base edge of the top cover
30
is provided with a plurality of positioning holes
34
for the insertion of the positioning pegs
23
such that the seat body
20
and the top cover
30
are aligned and positioned. Therefore, the base board
11
of the IC
10
can be mounted to the withholding protruded edge
22
of the seat body
20
and the bade body circuit
10
is positioned within the cavity
21
, and the top cover
30
is covered on to the end face of the seat body
20
. At this instance, the inspection glass
33
can be removed to inspect whether the wiring
12
has contacted the inspection glass
33
so as to determine whether the wiring
12
is an acceptable or is rejected.
However, this conventional device has the following drawbacks:
(1) Due the close distance between the groove
32
and the bottom edge of the top cover
30
, the fabrication of the top cover
30
is difficult and the size has to be very precise. Thus the cost of fabrication is high.
(2) As the base board
11
is positioned at the withholding protruded edge
22
, if the base board
11
has a slight bend, the inspection result will be affected.
(3) The positioning holes
34
for insertion by the pegs
23
frequently cause misalignment and the peg
23
may be broken due to impact of the top cover
30
.
(4) The inspection glass
33
cannot fully cover the base board
11
and the inspection of wiring
12
may wrongly contact the integrated circuit
10
, causing damage to the products.
In view of the above, it is an object of the present invention to provide an inspection device for wiring of an integrated circuit, which can solve the above-mentioned drawbacks.
SUMMARY OF THE INVENTION
Accordingly, it is an object of the present invention to provide an inspection device for wiring of integrated circuit (IC), which is easily made and provides a better accuracy in inspection of ICs.
An aspect of the present invention is to provide an inspection device for wiring of integrated circuit comprising a base seat and an inspection cover, wherein the top end of the base seat is provided with cavity of appropriate depth and having supporting rib, and the two lateral sides of the cavity are provided with protruded edge a little higher than the cavity, the inspection cover having two side blocks is provided with an extended frame stripe such that the two side blocks and the two frame stripes are formed into a frame body, and corresponding stripes are formed between the two side blocks such that the corresponding stripes divides the frame body into a plurality of observation region, and each observation region is adapted for inspection plate made from a transparent material, and the two side withholding seat of the inspection plate are located at the end face of the two side blocks, and the inspection plate moves along the end face of the two side blocks, and by means of two side-sealing block, the lateral side of the inspection cover is fixed and the individual inspection plate is limited to the position such that the plate will not dislocate, and the two frame stripe of the inspection cover and the corresponding base edge are mounted with corresponding protruded edge which is corresponding to the withholding protruded edge of the base seat and the supporting ribs; thereby the base plate of the IC is positioned at the withholding protruded edge of the base seat and at the end face of the supporting stripe, then the inspection cap correspondingly covers the base seat and the inspection plate is used to inspect the height of arch of the wiring of the integrated circuit.
The foregoing object and summary provide only a brief introduction to the present invention. To fully appreciate these and other objects of the present invention as well as the invention itself, all of which will become apparent to those skilled in the art, the following detailed description of the invention and the claims should be read in conjunction with the accompanying drawings. Throughout the specification and drawings identical reference numerals refer to identical or similar parts.
REFERENCES:
patent: 6320397 (2001-11-01), Wood et al.
patent: 6501291 (2002-12-01), Shen
Chuang Chia-Min
Su Chen-Ping
Tsai Ming-Lang
Yang Chon-Tsai
Cuneo Kamand
Lei Leong C.
Nguyen Trung Q.
Orient Semiconductor Electronics Limited
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