Geometrical instruments – Area integrators – Electrical
Patent
1980-05-16
1982-06-08
Little, Willis
Geometrical instruments
Area integrators
Electrical
33174P, G01B 520
Patent
active
043332404
ABSTRACT:
A device is disclosed for inspecting whether the surface of a discrete portion of a part is within an allowable tolerance. The device comprises a base adapted to position the part for inspection. A probe is moveably mounted to the base and adapted to engage the surface. The probe, in one preferred embodiment, comprises a member slidably mounted on the base having an edge adapted to engage the surface. A mechanism is provided for limiting the movement of the member to the allowable tolerance of the contour of the surface, such that when the part is positioned for inspection the member will indicate whether the surface is within allowable tolerance if the edge of the member makes contact thereon.
In another embodiment, the probe comprises a member slidably mounted to the base. A protractor, having an edge adapted to uniformly engage the surface, is mounted to the member and rotatable about an axis. A first mechanism is provided for limiting the movement of the member to the allowable contour tolerance and a second mechanism is provided for limiting the rotation of the protractor about the axis to an allowable angular tolerance of the surface. Thus, when the part is positioned for inspection in the base, the edge of the protractor will only make substantially uniform engagement with the surface when the surface is within allowable tolerance and will make at least less than uniform engagement when the surface is out of tolerance.
REFERENCES:
patent: 2545580 (1951-03-01), Hoppe
patent: 2579768 (1951-12-01), Tefft
patent: 2807092 (1957-09-01), Jones
Little Willis
Rockwell International Corporation
Silberberg Charles T.
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