Inspection device for inspecting TFT

Details Inspection device for inspecting TFT Inspection device for inspecting TFT

2007-10-16

2007-10-16

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C345S213000

Reexamination Certificate

active

10970555

ABSTRACT:
Provided is an inspection device which inspects a thin film transistor (TFT) for supplying a current to a light emitting element. The inspection device includes: a first current supply circuit which supplies a drain current between a drain and a source of the TFT; a gate voltage adjustment circuit which adjust a gate voltage to be applied to a gate of the TFT so as to allow a predetermined specified current to flow between the drain and source of the TFT; and a measurement unit which measures the gate voltage adjusted by the gate voltage adjustment circuit.

REFERENCES:
patent: 6784880 (2004-08-01), Fujita et al.
patent: 7053645 (2006-05-01), Chung
patent: 2002/0121917 (2002-09-01), Murakawa et al.
patent: 62-217169 (1987-09-01), None
patent: 04-329332 (1992-11-01), None
patent: 2002-108243 (2002-10-01), None
patent: 2002-72918 (2002-12-01), None

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