Inspection device and inspection method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07049826

ABSTRACT:
The present invention discloses a technique for inspecting a branched circuit wiring having branch portions branched halfway therefrom by using a less number of non-contact sensors. An inspection method for inspecting a branched circuit wiring having three or more ends, including the steps of: supplying an inspection signal to one end of the branched circuit wiring; disposing one or more non-contact sensors for detecting the inspection signal while being in non-contact with the branched circuit wiring over the remaining ends other than one end of the branched circuit wiring; and determining if any disconnection is caused in the branched circuit wiring, based on the inspection signal detected by the one or more non-contact sensors. The disposing step includes the step of arranging at least one of the one or more non-contact sensors to cover the remaining ends.

REFERENCES:
patent: 5969530 (1999-10-01), Yamashita
patent: 64-57178 (1989-03-01), None
patent: 4-12468 (1992-01-01), None
patent: 11-153638 (1999-06-01), None
patent: 2000-74975 (2000-03-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Inspection device and inspection method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspection device and inspection method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection device and inspection method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3584708

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.