Inspection chip producing method and specimen detecting method

Details Inspection chip producing method and specimen detecting method Inspection chip producing method and specimen detecting method

2009-02-23

2011-10-25

Pham, Hoa (Department: 2886)

Optics: measuring and testing

Of light reflection

C356S432000

Reexamination Certificate

active

08045171

ABSTRACT:
A method of producing an inspection chip includes a microstructure producing step of producing a microstructure where metallic portions having dimensions permitting excitation of surface plasmons are formed and distributed on one surface of a substrate, a specimen attaching step of attaching a specimen to the surfaces of the metallic portions of the microstructure, and a metallic particle attaching step of attaching metallic particles having dimensions permitting excitation of surface plasmons to the metallic portions and the specimen, wherein the specimen is attached to the metallic portions to which no substance capable of specifically binding to the specimen is secured in the specimen attaching step, and/or the metallic particles to which no substance capable of specifically binding to the specimen is secured are attached to the specimen in the metallic particle attaching step.

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