Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry
Patent
1991-06-28
1993-08-17
Kostak, Victor R.
Facsimile and static presentation processing
Facsimile
Specific signal processing circuitry
358101, 356376, H04N 718
Patent
active
052374041
ABSTRACT:
A surface defect inspection apparatus includes a light radiation source, arranged to oppose a surface to be inspected serving as a mirror surface, for radiating light having a predetermined change pattern toward the surface to be inspected, a camera mechanism for receiving an image of the light radiation source, reflected by the surface to be inspected and forming a received-light image corresponding to the change pattern of the light radiation source, and a discriminator for discriminating a surface defect portion on the surface to be inspected by discriminating a portion whose change pattern is different from the change pattern on the basis of the received-light image formed by the camera mechanism.
REFERENCES:
patent: 4559451 (1985-12-01), Carl
patent: 4629319 (1986-12-01), Clarke et al.
patent: 4742237 (1988-05-01), Ozawa
patent: 4868404 (1989-09-01), Hajime
patent: 5064291 (1991-11-01), Reiser
patent: 5072128 (1991-12-01), Hayano et al.
patent: 5119434 (1992-06-01), Bishop et al.
patent: 5129009 (1992-07-01), Lebeau
PCT Publication No. WO 89/01146 dated Feb. 9, 1989.
Official Office Action date May 20, 1992 issued in the matter of P 4121 464.1-52-Mazda Motor Corporation (with English Translation).
Ishiide Hidenori
Makimae Tatsumi
Sugihara Tsuyoshi
Tanaka Kazumoto
Utsunomiya Akinori
Kostak Victor R.
Mazda Motor Corporation
LandOfFree
Inspection apparatus with improved detection of surface defects does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Inspection apparatus with improved detection of surface defects , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection apparatus with improved detection of surface defects will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2248228