Inspection apparatus using electromagnetic waves

Details Inspection apparatus using electromagnetic waves Inspection apparatus using electromagnetic waves

2011-08-09

2011-08-09

Porta, David (Department: 2884)

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

C250S343000, C250S458100, C324S637000, C356S316000

Reexamination Certificate

active

07994478

ABSTRACT:
An inspection apparatus for acquiring information on a measurement object using electromagnetic waves, comprising a substrate; a transmission line that is formed on the substrate; an electromagnetic wave generating unit for supplying an electromagnetic wave to the transmission line; an electromagnetic wave detecting unit for detecting the electromagnetic wave that has propagated through the transmission line; and a walled structure. The walled structure includes a side wall portion that extends along the transmission line within a region in which the electromagnetic wave that propagates through the transmission line and the measurement object interact with each other.

REFERENCES:
patent: 2003/0040004 (2003-02-01), Hefti et al.
patent: 2007/0148047 (2007-06-01), Itsuji
patent: 2007/0215810 (2007-09-01), Kurosaka et al.
patent: 2007/0252992 (2007-11-01), Itsuji
patent: 2007/0279136 (2007-12-01), Koyama et al.
patent: 2007/0279143 (2007-12-01), Itsuji
patent: 2008/0116374 (2008-05-01), Ouchi et al.
patent: 2006-153852 (2006-06-01), None
T. Ohkubo, et al., “Micro-strip-line-based sensing chips for characterization of polar liquids in terahertz regime”, Applied Physics Letters 88, 212511, 2006.

Affiliated with

Also associated with

Rating

Inspection apparatus using electromagnetic waves does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspection apparatus using electromagnetic waves, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection apparatus using electromagnetic waves will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2765518