Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-01-15
2008-01-15
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S756010
Reexamination Certificate
active
11759816
ABSTRACT:
Disclosed is an inspection method for inspecting the electrical characteristics of a device by bringing an inspecting probe into electrical contact with an inspection electrode. An insulating film formed on the surface of the inspection electrode is broken by utilizing a fritting phenomenon so as to bring the inspection electrode into electrical contact with the inspection electrode.
REFERENCES:
patent: 3566263 (1971-02-01), Thompson
patent: 4477774 (1984-10-01), Revirieux
patent: 4851707 (1989-07-01), Lindway
patent: 4904946 (1990-02-01), Hirai
patent: 5258654 (1993-11-01), Roberts et al.
patent: 5523633 (1996-06-01), Imaizumi et al.
patent: 5594349 (1997-01-01), Kimura
patent: 5600578 (1997-02-01), Fang et al.
patent: 5773987 (1998-06-01), Montoya
patent: 5936419 (1999-08-01), Chen
patent: 6049213 (2000-04-01), Abadeer
patent: 6057694 (2000-05-01), Matsudo
patent: 6188234 (2001-02-01), Abadeer et al.
patent: 6326792 (2001-12-01), Okada
patent: 6525544 (2003-02-01), Okada
patent: 6529011 (2003-03-01), Okubo
patent: 6633177 (2003-10-01), Okada
patent: 6858448 (2005-02-01), Okada
patent: 64-048038 (1989-02-01), None
patent: 11-242062 (1999-09-01), None
Mark Beiley, et al. “A Micromachined Array Probe Card-Characterization” IEEE Transactions on Components, Packaging, and Manufacturing Technology-Part B, vol. 18, No. 1, Feb. 1995 pp. 184-191.
Iino Shinji
Itoh Toshihiro
Kataoka Kenichi
Suga Tadatomo
Takekoshi Kiyoshi
Itoh Toshihiro
Patel Paresh
Suga Tadatomo
Tokyo Electron Limited
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