Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-01-15
2008-01-15
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S756010
Reexamination Certificate
active
07319339
ABSTRACT:
Disclosed is an inspection method for inspecting the electrical characteristics of a device by bringing an inspecting probe into electrical contact with an inspection electrode. An insulating film formed on the surface of the inspection electrode is broken by utilizing a fritting phenomenon so as to bring the inspection electrode into electrical contact with the inspection electrode.
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Iino Shinji
Itoh Toshihiro
Kataoka Kenichi
Suga Tadatomo
Takekoshi Kiyoshi
Itoh Toshihiro
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Patel Paresh
Suga Tadatomo
Tokyo Electron Limited
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